Electrical Characterization includes many different techniques to evaluate ferroelectric, piezoelectric, dielectric and semiconductor materials and devices through a range of variables including time, temperature, frequency and voltage. Multiple instruments, test fixtures and ovens can be dynamically configured into measurement systems to achieve research objectives with many systems being completely automated. The following information is intended to convey the most common configurations and their limits. Extended capabilities often exist and should be discussed with staff.
SamplesCharacteristic Types
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Measurement Equipment
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Test / Techniques |
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