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Materials Characterization Lab
Characterization Techniques
Characterization Techniques
Atomic Force Microscopy
AFM
Auger Electron Spectroscopy
AES
Contact Angle
Density: Helium Pycnometry
Electrical Characterization Lab
ECL
Electron Backscattered Diffractometry
EBSD
Electron Probe MicroAnalysis
EPMA
Energy Dispersive Spectroscopy
EDS
Focused Ion Beam
FIB
Infrared Spectroscopy
FTIR
Mechanical
Mercury Porosimetry
Nanoindentation
Nanoscale Infrared Spectroscopy
Nano-IR/AFM-IR
Optical Microscopy
Optical Profilometry
Raman Spectroscopy
Reflection Electron Energy Loss Spectroscopy
REELS
Sample Prep
General Sample Prep
Scanning Electron Microscopy
SEM
Surface Area
Thermal Analysis
Time of Flight Secondary Ion Mass Spectrometry
TOF-SIMS
Transmission Electron Microscopy
TEM
Ultraviolet-Visible-near-IR Spectroscopy
UV-Vis-NIR
X-Ray Photoelectron Spectroscopy
XPS
X-ray Scattering
XRD / SAXS-WAXS
Zeta Potential
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