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The Materials Characterization Lab

 

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  2. Materials Characterization Lab
  3. Characterization Techniques

Characterization Techniques

Atomic Force Microscopy AFM AFM 3D topographic image
Auger Electron Spectroscopy AES Scanning Auger Microscope
Contact Angle Contact angle characterization
Density: Helium Pycnometry Density: Helium Pycnometry
Electrical Characterization Lab ECL Electrical Characterization
Electron Backscattered Diffractometry EBSD EBSD
Electron Probe MicroAnalysis EPMA EPMA
Energy Dispersive Spectroscopy EDS EDS
Focused Ion Beam FIB Focus Ion Beam
Infrared Spectroscopy FTIR FTIR - Infrared Spectroscopy
Mechanical Mechanical Characterization
Mercury Porosimetry Mercury Porosimetry
Nanoindentation Nanoindentation
Nanoscale Infrared Spectroscopy Nano-IR/AFM-IR Nanoscale Infrared Spectroscopy
Optical Microscopy Optical Microscopy
Optical Profilometry optical Profilometry
Raman Spectroscopy RAMAN
Reflection Electron Energy Loss Spectroscopy REELS Electron beam example
Sample Prep General Sample Prep Sample Prep
Scanning Electron Microscopy SEM Scanning Electron Microscopy
Surface Area Surface Area
Thermal Analysis Thermal
Time of Flight Secondary Ion Mass Spectrometry TOF-SIMS TOF-SIMS image
Transmission Electron Microscopy TEM TEM image
Ultraviolet-Visible-near-IR Spectroscopy UV-Vis-NIR UV-Vis-NIR
X-Ray Photoelectron Spectroscopy XPS XPS
X-ray Scattering XRD / SAXS-WAXS X-ray Scattering
Zeta Potential Zeta Potential

Explore More

  • Atomic Force Microscopy
  • Auger Electron Spectroscopy
  • Contact Angle
  • Density: Helium Pycnometry
  • Electrical Characterization Lab
  • Electron Backscattered Diffractometry
  • Electron Probe MicroAnalysis
  • Energy Dispersive Spectroscopy
  • Focused Ion Beam
  • Infrared Spectroscopy
  • Mechanical
  • Mercury Porosimetry
  • Nanoindentation
  • Nanoscale Infrared Spectroscopy
  • Optical Microscopy
  • Optical Profilometry
  • Particle Size Analysis
  • Raman Spectroscopy
  • Reflection Electron Energy Loss Spectroscopy
  • Sample Prep
  • Scanning Electron Microscopy
  • Surface Area
  • Thermal Analysis
  • Time of Flight Secondary Ion Mass Spectrometry
  • Transmission Electron Microscopy
  • Ultraviolet-Visible-near-IR Spectroscopy
  • X-Ray Photoelectron Spectroscopy
  • X-ray Scattering
  • Zeta Potential
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  • addressThe Materials Research Institute
    Millennium Science Complex
    Pollock Road
    University Park, PA 16802
Copyright © The Pennsylvania State University | Materials Research Institute. All rights reserved.

The 2DCC-MIP is funded by NSF cooperative agreement DMR-1539916.

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