Nanoscale Infrared Spectroscopy

Infrared (IR) spectroscopy is useful for the identification of both organic and inorganic compounds. However, the best lateral resolution achieved through standard IR techniques is > 10 microns. A new atomic force microscopy (AFM) technique now enables the detection of IR spectral response with a lateral resolution down to 10 nm. This detection is performed using a tunable IR laser and measuring changes in surface forces as a result of IR absorption in the sample via the AFM cantilever deflection.

Nano IR spectroscopy
Cover art: Analytical Chemistry

Technique Advantages

  • IR spectroscopy with a lateral resolution down to 10 nm
  • AFM-IR provides compound specific spectral fingerprint

Bruker Dimension Icon-IR

Two tunable IR laser sources

  • QCL laser: 780 to 1810 cm-1
  • OPO laser: 2700 to 4300 cm-1

AFM-IR modalities include (all have phase lock-loop control):

  • Contact AFM-IR
  • Resonance Contact AFM-IR
  • Tapping AFM-IR
  • Surface Sensitive AFM-IR (AFM feedback is contact mode)
    • No phase lock-loop control for SS AFM-IR 

Stage supports samples up to 150 mm diameter 

Scan types include: 

  • IR spectral scan mode (single point, line and/or array scans with site specific precision using MiroView) 
  • AFM-IR maps (acquire AFM scan at specific IR absorption band)
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