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Technical Contacts

Villalpando, Manuel

Research Support, Sample Prep

MCL - N-003 Millennium Science Complex
University Park, PA 16802

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Sample Prep

Sample Preparation

Leica TXP

The Leica  TXP is a target preparation device for milling, sawing, grinding, and polishing samples prior to examination by SEM, TEM, and LM techniques.

An integrated stereomicroscope allows pinpointing and easy preparation of barely visible targets.

With the specimen pivot arm the sample can be observed directly at an angle between 0° and 60°, or 90° to the front face for distance determination with an eyepiece graticule.

ATM Brilliant

Product Advantages

  • Precision cutting machine
  • Spacious cutting chamber with large table
  • Openings on left and right for continuous long parts
  • Electronic control with LC display
  • Electronic travel measurement
  • Electronic performance control
  • Various cutting modes
  • Memory function for saving programs
  • Manual movement of all axis via joystick (automatic mode only)
  • Current safety standard
  • LED chamber illumination

Princeton Scientific Tech Wire Saw

Sample Max Dimensions:
approx. 40x40mm
Power Supply:
220-250 V/50 Hz or 110 V/60 Hz
Wire Diameter:
20-60 μm
Wire Oxcillation Frequency:
48 kg

Leica Ion Mill

An excellent sample preparation is key for observing the finest textures and details on the sample surface in high resolution. The right workflow and tools for the pre-preparation will not only lead to an excellently prepared sample, it will also reduce the procedure time, streamline the workflow, and produce reliable and precise results.