Difficult/heterogeneous samples can be prepared for EBSD, nanoindentation, AFM/Optical profilometry, and other analyses.
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| Gatan PIPS-II is a low-kV ion milling system, which enables us to prepare TEM specimens with extremely thin (<5nm) damaged layers. | The Leica TIC3 Ion Mill is used for various types of broad area milling, sectioning, and polishing. |
EBSD map of sample prior to ion milling
EBSD map of sample after ion milling
Manual polishing
Ion milling