Ion milling and polishing

Difficult/heterogeneous samples can be prepared for EBSD, nanoindentation, AFM/Optical profilometry, and other analyses.

Gatan PIPS-II is a low-kV ion milling system, which enables us to prepare TEM specimens with extremely thin (<5nm) damaged layers. The Leica TIC3 Ion Mill is used for various types of broad area milling, sectioning, and polishing.
EBDS prior
EBSD map of sample prior to ion milling
EBDS post
EBSD map of sample after ion milling
manual polish
Manual polishing
Machine milling
Ion milling
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