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Ion Mill / Ion Polishing

Ion Milling / Polishing

Difficult/heterogeneous samples can be prepared for EBSD, nanoindentation, AFM/Optical profilometry, and other analyses.

Gatan PIPS-II is a low-kV ion milling system, which enables us to prepare TEM specimens with extremely thin (<5nm) damaged layers. The Leica TIC3 Ion Mill is used for various types of broad area milling, sectioning, and polishing.

 


 

EBSD map of sample prior to ion milling

EBSD map of sample after ion milling


Manaul polishing
Ion milling