Ion milling and polishing

Difficult/heterogeneous samples can be prepared for EBSD, nanoindentation, AFM/Optical profilometry, and other analyses.

Gatan PIPS-II is a low-kV ion milling system, which enables us to prepare TEM specimens with extremely thin (<5nm) damaged layers.

The Leica TIC3 Ion Mill is used for various types of broad area milling, sectioning, and polishing.

A mechanically polished sample before and after ion milling
EBSD of mechanically polished sample showing scratches and poor quality

Sample before and after ion milling

​​​​​​Sample before and after ion milling


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