Ion milling and polishing

Difficult/heterogeneous samples can be prepared for electron backscatter diffraction (EBSD), nanoindentation, AFM/Optical profilometry, and other analyses.

Gatan PIPS-II is a low-kV ion milling system, which enables us to prepare TEM specimens with extremely thin (<5nm) damaged layers. The Leica TIC3 Ion Mill is used for various types of broad area milling, sectioning, and polishing.

A mechanically polished sample before and after ion milling
EBSD of mechanically polished sample showing scratches and poor quality

 

Sample before and after ion milling

​​​​​​Sample before and after ion milling