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Thin film piezoelectrics offer a number of advantages in microelectromechanical systems (MEMS), due to the large motions that can be generated, often with low hysteresis, the high available energy densities, as well as high sensitivity sensors with wide dynamic ranges, and low power requirements. The Trolier-McKinstry group has explored a wide range of perovskite thin films for these applications, and has developed new characterization tools for measurement of thin film piezoelectric properties.
The coming decades present a host of challenges for our built environments: a rising global population combined with increasing urbanization; crumbling infrastructure and dwindling resources to rebuild it; and the growing pressures of a changing climate, to name a few.