AFM-IR characterization technique imagery

AFM-IR is a characterization technique that combines the chemical specificity of FTIR spectroscopy and the sub-…

Laboratory Equipment Operations LEO wordmark

The LEO Registration process has been updated to offer a streamlined and user-friendly experience for Penn State…

Fluorescent images in the nanofab

This year's comprehensive maintenance week has once again proven its tremendous value to our nanofabrication…

Fall MatSE classroom

The Materials Characterization Laboratory will offer two hands-on characterization courses this fall.  Space…

TA Instruments and MCL logos promoting a workshop

Join us for an informative workshop where MCL's thermal analysis suite will be showcased. This session will cover…

Summer 2025 REU group photo outside the MSC and in the nanofab

Co-hosted by the 2DCC and the Nanofab Nanomanufacturing of Emerging 2D Materials and Devices

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Rate Setting and Subsidy Levels