- Auger Electron Spectroscopy (AES): is able to measure elemental composition of different areas of patterned or integrated devices.
- X-Ray Photoelectron Spectroscopy (XPS or ESCA)
- Energy Dispersive X-Ray Spectroscopy (EDS)
- Fourier Transform InfraRed spectroscopy (FTIR)
- Nearfield Scanning Optical Microscopy (NSOM)
The above techniques all reside within the Materials Characterisation Laboratory facilities.