Equipment & Training Schedule

Equipment List

Technical Contacts

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Characterization

Characterization

Characterization Capabilities

Spectroscopy

  • Auger Electron Spectroscopy (AES): is able to measure elemental composition of different areas of patterned or integrated devices.
  • X-Ray Photoelectron Spectroscopy (XPS or ESCA)
  • Energy Dispersive X-Ray Spectroscopy (EDS)
  • Fourier Transform InfraRed spectroscopy (FTIR)
  • Nearfield Scanning Optical Microscopy (NSOM)

The above techniques all reside within the Materials Characterisation Laboratory facilities.