Title: Fundamentals of Secondary Ion Mass Spectrometry
Abstract: Secondary Ion Mass Spectrometry offers analysis of inorganic and organic materials with ppm to ppb detection limits. Owing to its low detection limits and ability to obtain in-depth information dynamic-SIMS has been used extensively by the semiconductor community for depth profiling of dopants in a variety of electronic materials. More recently static-SIMS has been applied to organic and biological material analysis. This presentation will introduce users to both the dynamic SIMS and static SIMS techniques, including how the techniques work, quantification, instrumentation, strengths and limitations of the technique, and applications.
Host: Jerry Hunter (email@example.com), Director of the Wisconsin Centers for Nanoscale Technology, University of Wisconsin-Madison
Title: Practical aspects in XRD/XRR analysis of materials
Abstract: This presentation will focus on practical guidelines for the most efficient ways to apply x-ray diffraction (XRD) and reflectivity (XRR) for the characterization of various material systems. We will provide a brief review of basic concepts of x-ray analysis methods with focus on appropriate measurement strategies. Potential artifacts and errors when carrying out typical data collection and/or data processing will be discussed. We will cover a variety of representative case studies will be presented ranging from the analysis of powder materials, textured structures, complex heterostructures and multilayers requiring high-resolution configurations, and soft materials.
Host: Mauro Sardela (firstname.lastname@example.org), Director, Central Research Facilities, Materials Research Laboratory, University of Illinois at Urbana-Champaign
Upcoming Webinars for the week of April 6
Monday, April 6 - Introduction to Confocal Raman Microscopy – Bing Luo (email@example.com), University of Minnesota
Wednesday, April 8 - Rutherford Backscattering - Greg Haugstad (firstname.lastname@example.org), University of Minnesota Director of Characterization Facility
Friday, April 10 - Nanoindentation and Mechanical Properties with AFM - Julie Morasch (email@example.com), University of Wisconsin