Making the Best of a Bad Situation Webinar Series 2020
The Making the Best of a Bad Situation characterization webinar series has come to an end. We hope that you found these as valuable as we did. We’d like to thank all the presenters that took the time to share their expertise with this large community. If you have future characterization questions, please feel free to contact one of the organizers. We enjoy solving complex problems, and as Land Grant Universities, outreach is an integral part of our core mission. Thanks also for financial support of the NSF MRSEC Center for Nanoscale Science at Penn State.
Sincerely,
| Jeff Shallenberger Penn State University jxs124@psu.edu |
Jerry Hunter University of Wisconsin jerry.hunter@wisc.edu |
Mauro Sardela University of Illinois sardela@illinois.edu |
Greg Haugstad University of Minnesota cfac-dir@umn.edu |
May 29: Polarization Effects in Raman Spectroscopy
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May 27: cryo-TEM and 3D reconstruction
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May 22: 3D Optical Prolifometry
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May 20: Soft Materials (thermal analysis)
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May 18: Auger Electron Spectroscopy
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May 15: Dynamic SIMS: A Powerful Tool for Depth Profiling
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May 13: Time-of-Flight Secondary Ion Mass Spectrometry: Biological Applications
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May 11: Introduction to Focus Ion Beam (FIB)
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May 8: Nanoscale 3D Imaging Mass Spectroscopy – Introduction to Atom Probe Tomography
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May 6: Application of Industrial X-ray CT to Characterize Biotic and Abiotic Matter
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May 4: Surface Characterization and Modification of Li-Ion Battery Materials
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May 1: An Introduction to EPMA for Materials Science
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April 27: Introduction to Scanning Electron Microscopy
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April 24: TOF-SIMS: Introduction and Materials Applications
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April 22: Multifrequency AFM and AFM-IR
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April 20: Introduction to Atomic Force Microscopy (AFM)
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| April 17: Introduction to Small Angle X-ray Scattering (SAXS)
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April 15: Introduction to TEM
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April 13: Particle size analysis: which technique to choose?
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April 10: Measuring nanoscale mechanical properties: nanoindentation and AFM Indentation techniques
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April 8: Introduction to Rutherford backscattering (RBS) and complementary ion beam analysis (IBA) methods
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April 6: Introduction to Confocal Raman MicroscopyHosted by Bing Luo, University of Minnesota |
April 3: Practical aspects in XRD/XRR analysis of materials
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APRIL 1: Fundamentals of Secondary Ion Mass Spectrometry (SIMS)
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