Subscribe

Free subscriptions to newsletters, print publications, and more

Summer Lecture and Workshop Series

2022 MCL Workshops

On Tuesdays and Thursdays throughout the summer MCL staff will be offering a series of free, one-hour lectures and workshops on various characterization topics. These will include a mixture of basic overviews of techniques aimed at anyone interested in these methods and more focused workshops primarily aimed at users that are currently trained in a technique but want to pursue a more advanced skill. Please see the list of topics and links to register below. If you have any issues registering, please contact Jen Dangelo (jlr110@psu.edu).

JULY SCHEDULE

WORKSHOP

July 7 - Thursday
11:15 a.m. - 12:15 p.m.

Review Phase ID Whole Pattern Fitting Powder XRD Patterns Using Jade Software

Analyzing powder diffraction data is often the most difficult part of an XRD experiment. Fortunately, there are software tools and databases available to make this process easier. Join Nichole Wonderling for a review of the program Jade (MDI, Inc., Livermore, CA) and the ICDD PDF-4+ database to learn how to perform phase identification search matches, background removal, profile fitting, data exporting and use of an internal standard for pattern calibration and lattice parameter determination.

SIGN UP TO ATTEND IN-PERSON:

In-person Sign Up


LECTURE

July 12 - Tuesday
11:15 a.m. - 12:15 p.m.

Introduction to Transmission Electron Microscopy (TEM)

In Transmission Electron Microscopy, a high energy electron beam is scattered as it is transmitted through a very thin sample which can provide information about the internal structure of the sample. There is a wealth of information that can be obtained at nanometer length scales from transmission electron microscopy including crystal structure, elemental composition and chemistry, phase distributions, dimensions of nanoscale structures, etc. In this overview, we will discuss the fundamental principles of TEM, the types of information that can be obtained from TEM, and the instrumentation available at PSU.   

IN-PERSON ONLY:

In-person Sign Up

SIGN UP TO ATTEND VIRTUALLY:

Virtual Sign Up


LECTURE

July 14 - Thursday
11:15 a.m. - 12:15 p.m.
In-situ TEM

Transmission Electron Microscopy is a powerful tool for understanding the structure and composition of materials at nanometer length scales. However, limitations on beam dose, stability in vacuum, and other environmental parameters have made it difficult to perform certain types of experiments and analyses in the microscope. Lately, many of these barriers have been overcome through new detectors and sample holders. This presentation will focus on how new detectors and in-situ holders can be used for examining samples in liquids or gases, and while heating and/or electrically biasing samples. This allows us to look at samples in their native state, or watch as dynamic reactions or transformations happen in the microscope.

SIGN UP TO ATTEND IN-PERSON:

In-person Sign Up

SIGN UP TO ATTEND VIRTUALLY:

Virtual Sign Up


WORKSHOP July 19 - Tuesday
11:15 a.m. - 12:15 p.m.
Electrochemical impedance spectroscopy (EIS): Theory and applications

We will go over the theoretical background of the EIS technique and the applications it can be used in.

IN-PERSON ONLY:

In-person Sign Up


LECTURE July 21 - Thursday
11:15 a.m. - 12:15 p.m.
Basic Principles of Powder X-ray Diffraction

Join Nichole Wonderling to review the basic theory of X-ray diffraction, learn what type of information the technique provides, and see a few examples.

SIGN UP TO ATTEND IN-PERSON:

In-person Sign Up

SIGN UP TO ATTEND VIRTUALLY:

Virtual Sign Up


LECTURE July 26 - Tuesday
11:15 a.m. - 12:15 p.m.
Introduction to Auger Spectroscopy

Auger Electron Spectroscopy (AES) is a complementary technique to X-ray Photoelectron Spectroscopy (XPS). In both analysis techniques, elemental and chemical surface information from the top ~7nm of a material are provided. AES is generally used for the analysis of conductive and semiconducting samples, particularly when higher spatial resolution is required over what is achievable by XPS. In this talk, we will go over briefly the theory of the technique. Then we will go over specific applications that discuss the advantages as well as the challenges in AES analysis.   

IN-PERSON ONLY:

In-person Sign Up

SIGN UP TO ATTEND VIRTUALLY:

Virtual Sign Up


WORKSHOP July 28 - Thursday
11:15 a.m. - 12:15 p.m.
Electrochemical impedance spectroscopy (EIS): Hands-on experiments

We will show the users how to use the tool we have to get the raw data and how to apply the corrections necessary to get the most accurate experimental data.

IN-PERSON ONLY:

In-person Sign Up


AUGUST SCHEDULE

WORKSHOP

August 2 - Tuesday
11:15 a.m. - 12:15 p.m.

Quantification of XPS: Theory and Practice

This lecture will cover what effects the signal generation in an XPS experiment. It will discuss both first principles and lab-derived quantification. It is aimed at anyone with an interest in this topic.

SIGN UP TO ATTEND IN-PERSON:

In-person Sign Up

SIGN UP TO ATTEND VIRTUALLY:

Virtual Sign Up

WORKSHOP

August 4 - Thursday
11:15 a.m. - 12:15 p.m.

Workshop: Quantifying XPS data using CasaXPS

This workshop is meant to teach active XPS users how to implement quantification discussed in the Tuesday lecture on data using CasaXPS. It is not recommended for people not familiar with CasaXPS.

IN-PERSON ONLY:

In-person Sign Up

WORKSHOP

August 9 - Tuesday
11:15 a.m. - 12:15 p.m.

Intro to Optical Profilometry

This is an introduction to optical profilometry lecture. It is aimed at anyone that is interested in learning about OptPro and how it works.

SIGN UP TO ATTEND IN-PERSON:

In-person Sign Up

SIGN UP TO ATTEND VIRTUALLY:

Virtual Sign Up

WORKSHOP

August 11 - Thursday
11:15 a.m. - 12:15 p.m.

OptPro data analysis with Mx, Gwyddion, and Keyence Multifile Analyzer

A workshop on OP data analysis with Mx, Gwyddion, and Keyence Multifile Analyzer

SIGN UP TO ATTEND IN-PERSON:

In-person Sign Up

SIGN UP TO ATTEND VIRTUALLY:

Virtual Sign Up



PAST WORKSHOPS 2022

LECTURE

May 17 - Tuesday
11:15 a.m. - 12:15 p.m.
Introduction to X-ray Photoelectron Spectroscopy (XPS)

This lecture is aimed at anyone with an interest in learning about X-ray photoelectron spectroscopy. The principle of the technique will be discussed and the advantages and disadvantages along with case studies.


LECTURE

May 19 - Thursday
11:15 a.m. - 12:15 p.m.
Intro to Focused Ion Beam

The focused ion beam (FIB) is a complement to a scanning electron microscope (SEM).  The two can be used to observe the subsurface structure and make site-specific modifications.  FIB also enables one to 1) perform complex patterning, 2) make site-specific cross-sections, 3) prepare transmission electron microscopy (TEM) samples and 4) observe the 3D structure by serial sectioning.  This talk is geared toward those who want to hear the types of problems that can be solved with the FIB.


LECTURE

May 24 - Tuesday
11:15 a.m. - 12:15 p.m.
Overview of XPS Curve Fitting

This lecture introduces curve fitting of XPS data. It is aimed at people who are currently generating XPS data or processing data generated on their behalf. It is meant to be combined with the hands-on Workshop on "Curve fitting using CasaXPS Software". It will discuss constraining of fitting parameters, asymmetric vs symmetric line shapes, and checking the validity of your fits.


WORKSHOP

May 26 - Thursday
11:15 a.m. - 12:15 p.m.
Curve Fitting XPS Spectra Using CasaXPS

Bring your laptop pre-loaded with CasaXPS software to this workshop.  It is aimed at people who are currently processing XPS data. Some model raw data files will be shared ahead of the workshop and we will work through the process of curve fitting various examples. If you are interested but do not yet have CasaXPS software, please contact Jeff Shallenberger (jxs124@psu.edu) prior to the workshop.


JUNE SCHEDULE

LECTURE June 2 - Thursday
11:15 a.m. - 12:15 p.m.

Nuances and Complications in IR Data Interpretation

This lecture goes over some simple strategies in interpreting FT-IR spectra. We will discuss the factors that influence peak positions and widths, and go over ways of assigning peaks.


LECTURE

June 7 - Tuesday
11:15 a.m. - 12:15 p.m.

Raman Analysis of Carbon Materials - Crystallinity, SP2/SP3 Ratio, Defect Type

Raman spectroscopy is one of the most referenced techniques when determining structure or defects in carbon materials. However, countless papers will reference the D/G peak intensity ratio from the Raman spectrum of carbon materials without the realization or acknowledgment that this ratio is non-monotonic with respect to the amorphitization trajectory of carbon. Come find out the correct method for interpreting defects in carbon materials and all that can be revealed through Raman analysis of carbon materials.


WORKSHOP June 9 - Thursday
11:15 a.m. - 12:15 p.m.
OPUS FTIR Data Processing

This will go over some simple data processing function available in OPUS, such as peak fitting, integration, Fourier transforms and apodization.


WORKSHOP June 16 - Thursday
11:15 a.m. - 12:15 p.m.
Raman Analysis of Carbon Materials - Crystallinity, SP2/SP3 Ratio, Defect Type

Raman spectroscopy is one of the most referenced techniques when determining structure or defects in carbon materials. However, countless papers will reference the D/G peak intensity ratio from the Raman spectrum of carbon materials without the realization or acknowledgment that this ratio is non-monotonic with respect to the amorphitization trajectory of carbon. Come find out the correct method for interpreting defects in carbon materials and all that can be revealed through Raman analysis of carbon materials.


LECTURE June 21 - Tuesday
11:15 a.m. - 12:15 p.m.
Introduction to AFM

This is an introduction to AFM lecture. It is aimed at anyone that is interested in learning about AFM and how it works.


WORKSHOP June 23 - Thursday
11:15 a.m. - 12:15 p.m.
Thin Film Characterization with X-Ray Reflectivity (XRR)

Workshop on the non-destructive characterization of thin film samples using X-Ray Reflectivity (XRR) to determine film thickness, density, and roughness information of heterostructure samples.


WORKSHOP June 28 - Tuesday
11:15 a.m. - 12:15 p.m.
AFM Data Analysis with Nanoscope Analysis and Gwyiddion

A workshop on AFM data analysis with Nanoscope Analysis and Gwyddion.


LECTURE

June 30 - Thursday
11:15 a.m. - 12:15 p.m.
Introduction to AFM-IR

The invention of the AFM-IR technique, the ability to measure IR spectra on the lateral length scale of several nanometers, occurred in 2010. Only 4 years later, the inventor, Alexander Dazzi, was awarded the Ernst Abbe award for his invention and the technique has been rapidly commercialized. This talk will provide a basic overview of the AFM-IR technique including capabilities, limitations and a few example applications from work performed by Penn State researchers.


View and sign up for multiple events

Complete Listing & Sign Up

Share