Given the sensitive nature of scanning probe microscopes (SPM) they cannot be used in noisy environments. I will briefly describe an active cancellation process that nullifies the appearance of vibrational noise by adding a drive signal into the existing Z-feedback loop of the SPM. This inexpensive and easy solution requires no major instrumental modifications and is ideal for those looking to use a microscope in noisier environments, e.g. coupled to active cooling systems or for use in the field. This general approach can be employed to eliminate the various types of noise which compromise sensitive measurement techniques. We invite ideas and suggestions to expand the application of this approach to other techniques which might benefit from active noise cancellation.
