When synthesizing materials for applications in electronics, optoelectronics and other applications the crystalline quality of the material is usually of high importance. X-ray diffraction, historically, has been widely implemented to assess crystal structure and imperfections present in the crystal lattice. While this is routinely done for samples that are around 10 nm and thicker, for monolayer materials like two-dimensional transition metal dichalcogenides such characterization is much more challenging. In this presentation I will discuss how XRD can be leveraged to study ultra-thin 2D layered materials.
