EDS in SEM is often used to map compositional information across length scales ranging from microns down to many nanometers and EDS in TEM can provide analogous information on the nanometer scale. However, it is often helpful to have information complementary to the elemental information attainable via EDS. The MCL has several techniques capable of providing information about chemical bonding, oxidation states, and chemical structure. In this talk, we will highlight several spectroscopic techniques such as XPS, EELS, Raman, or FTIR which can provide information at various length scales and across a range of materials.