The specific technique, details of the acquisition method, along with how data is processed all influence the quantification of surface roughness.  Furthermore, the commonly reported roughness parameters of average roughness and RMS roughness are often inadequate to fully characterize the texture of a surface.  This talk will provide an overview of what differences you should expect between surface roughness data coming from AFM, OP, and even stylus profilometry as well as an introduction to advanced surface texture parameters.