One of the founding staff members of the Materials Research Institute, Jeff Shallenberger, returned to Penn State in April after 10 years in industry. Jeff has been appointed the leader of the Surface Analysis Group within the Materials Characterization Lab (MCL). The surface group at MCL includes new XPS and Time-of-flight secondary ion mass spectrometry (TOF-SIMS) instrumentation as well as Auger electron spectroscopy services. Jeff’s expertise involves surface sensitive spectroscopies, particularly x-ray photoelectron spectroscopy.
Surface chemistry is critical to a wide range of phenomena, including corrosion, adhesion, biocompatibility, and catalysis. The semiconductor industry is among the major users of surface analysis, since their technology is based upon making structures from thin films.
Jeff received his BS and MS degrees in materials science from Penn State. He then joined MRI, where he helped merge the MCL and MRL analytical facilities into the current MCL. After leaving Penn State, Jeff spent a decade managing various labs for Evans Analytical Group.
In addition to his role as group lead, Jeff will use his industry background and 25 years of characterization experience to help industrial collaborators access all of MCL’s analytical instrumentation and expertise in order to solve their complex problems.
Contact Jeff at firstname.lastname@example.org or 1 814 863-1994.