Seeing is Believing: New sSNOM Tool for Nanoscale Optical Characterization
Capability to investigate properties of materials by non-destructive optical tools is fundamentally limited by diffraction (Abbe’s limit). Since nanomaterials, by definition, may have properties modulated at the scale of a few nanometers, the ultimate methods of characterization are required, with good enough spatial resolution, sensitive to optical/electronic properties. Until recently, those have been limited to electron microscopy based.
This talk will present scattering-type scanning near-field optical microscopy (sSNOM) as a technique to reveal optical properties of regular (and twisted) 2DMs. A range of methods will be covered that allow to reach beyond simple imaging: for example, in twisted graphene, phonon-plasmon polariton coupling will be discussed in detail.
Dr. Slava V. Rotkin, Materials Research Institute, Department of Engineering Science & Mechanics, Department of Biomedical Engineering, Penn State University
Date & Time
September 17, 2019
Millennium Science Complex, N-201