Atomic Force and Scanning Tunneling Microscopy for Atomic Scale Investigations of 2D Materials
Summary: In this talk I will introduce a variety of atomic force (AFM) and scanning tunneling microscopy (STM) measurement techniques for atomic scale investigations of the structural and electronic properties of materials, with examples drawn primarily from investigations of 2D material systems.
DATE: October 3, 2017
TIME: 12:00 pm - 1:00 pm EST
SPEAKER: Dr. Eric Hudson, Penn State University, Associate Professor of Physics and Associate Head for Diversity and Equity
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