SEMINAR: Texture analysis in materials science using X-ray diffraction

Hans te Nijenhuis, Malvern PANalytical, The Netherlands

Most commonly used solid materials are polycrystalline and show a texture, a non-random orientation distribution of the crystallites. Since almost all physical properties of crystalline materials strongly depend on the crystal orientation, the materials properties can only be understood if the texture of a sample is known.

Texture is typically a result of the history of the manufacturing process. Understanding and controlling the texture during processing is important in order to obtain the desired materials properties. Knowledge of the evolution of preferred orientations can provide valuable information in order to optimize the manufacturing process.

X-ray diffraction is a widely used technique to determine preferred orientations. The seminar gives an overview of the theory and practice of texture analysis in materials science using modern X-ray diffraction techniques. Representations of preferred orientations, diffraction geometries and practical examples of texture analysis will be discussed.

About the speaker

Hans te Nijenhuis is product manager at Malvern PANalytical, based in Almelo, the Netherlands. He has a background in applied crystallography (Delft University of Technology) and crystal growth (Radboud University Nijmegen). At Malvern Panalytical he is team leader for customized solutions for the X-ray diffraction product line.

Time and Location

Tuesday, November 14, 2017
11:00 a.m.
N-201 Millennium Science Complex