A Practical Approach to Thin Film Metrology
Are you analyzing thin films? Is thin film x-ray metrology a bottleneck in your production steps? Did you know that your PANalytical system can automate analysis of your data? Let us give you some useful tips on data collection and analysis using your PANalytical hardware and software programs.
This complimentary one day seminar will include lectures and discussions on sample optimization and analysis best practices for both polycrystalline and epitaxial thin films. Measurements such as grazing incidence diffraction and reflectometry of polycrystalline films and rocking curves and reciprocal space mapping for epitaxial films will be discussed. Additionally, there will be a live demonstration of film/wafer alignment on an X’Pert3 MRD using Data Collector software, as well as live software demonstrations of analysis procedures and tips using X’Pert Reflectivity and X’Pert Epitaxy analysis software packages. Advanced analysis techniques, such as film strain, in-plane analysis and Ultra-fast reciprocal space mapping with our PIXcel3D detector, will also be briefly discussed.
Mike Hawkridge, PANalytical Aplications Specialist
MSC Building, Room N201 University Park Campus
Date and Time
March 23, 2017
8:30 a.m.: Coffee/pastry and Check-in
9:00 a.m. - 4:00 p.m.: Workshop
YOU MUST REGISTER IN ADVANCE TO ATTEND THIS WORKSHOP
Space Is Limited! Register through PANalytical's website.
No Cost Compliments of PANalytical, Inc.
March 17, 2017
Telephone: 814-865-2328 for further information if needed.
|8:30 a.m.||Check-in & Coffee and Pastries|
|9:00 a.m. - 9:15 a.m.||Welcome|
|9:15 a.m. - 12:00 p.m.||
Polycrystalline Films Section (with 15 minute coffee break)
|12:00 p.m. - 1:00 p.m.||Catered Lunch|
|1:00 p.m. - 4:00 p.m.||
Epitaxial Film Section (with 15 minute coffee/light snack break)
|4:00 p.m. - 4:30 p.m.||Advanced Techniques|
|4:30 p.m.||Workshop Ends|