Optimization of S/TEM Specimen Prep via FIB: from Alpha to Omega

Course Description

Lucille Giannuzzi of EXpressLO LLC and Wayne Harlow of Drexel University will give a FIB specimen prep short course “Optimization of S/TEM Specimen Prep via FIB: from Alpha to Omega” on Wed Oct 12th from 9-4. 

  • The course will include a morning of lectures including:
    • An overview of basic FIB methods and applications for S/TEM preparation
    • Low energy polishing
    • Methods to avoid redeposition
    • “Pre-thinning” FIB methods
    • in situ and ex situ  lift out techniques.
    • Specimen prep for in situ cells including a 45 min presentation by Wayne Harlow from Drexel who will describe experimental details and S/TEM results on how his group prepares specimens for Protochips in situ heating/biasing TEM cells
  • The afternoon includes live demos in the lab for preparing FIB specimens for conventional and in situ S/TEM.

Instructor

Lucille Giannuzzi, EXpressLO LLC
Wayne Harlow, Drexel University

Location

MSC Building, Room N-201
University Park Campus

Date and Time

October 12, 2016
9:00 am - 4:00 pm

Cost and Registration

Registration is Compliments of Materials Characterization Lab and EXpressLO LLC
Registration is required to attend

Register Here

Registration Deadline

October 9, 2016

Schedule

8:30 Check-in with coffee and pastry
9:00 Strategies for preparing samples for conventional TEM, STEM and in situ cells
12:00 Lunch
1:00 Live demos in the FIB lab; preparing specimens for conventional and in situ TEM