Current Workshops & Seminars

July 24, 2019

Thermal Analysis Workshop

This course will focus on theory, applications, and optimization of test conditions. Charles Potter, Ph.D., (30+ years experience) application scientists at TA Instruments, will be speaking.

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Past Workshops

June 12, 2019

SEM Workshop
A one day course with lectures covering the basic theory and operation of an SEM.  There will be sign-up sheets for demos on June 13thif the attendee is interested.  

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February 27, 2019

Photothermal IR Microscopy
Photothermal IR Microscopy provides sub-micron spatial resolution IR mapping capabilities without the need to contact the sample. One of the most unique applications for this technique is the ability to acquire an IR spectra depth profile with 3-5 micron spatial resolution. Additionally, because this technique is non-contact, samples can be mapped through a coverslip with sub-micron spatial resolution. Come learn more about this technique on February 27th and how it may help your research. Those who attend the workshop are invited to demo the instrument on the 28th and 29th.

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August 13 - 24, 2018

August 13 - 24, 2018 - The Penn State Microscopy School: Electron Microscopy Methods at the Convergence of Materials and Life Sciences
This two-week course will emphasize TEM methods that can be applied to both life and materials sciences. Similar scientific challenges have evolved in both disciplines. As such, synergistic opportunities exist for researchers that choose to cross disciplinary boundaries and apply techniques initially developed in other fields.

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March 21, 2018

March 21, 2018 - Four-Probe Resistivity and Hall Voltage Measurements
This workshop will give a Parametric Analyzer Overview with a focus on making bulk and surface resistivity measurements.

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November 15-16: Electron Probe MicroAnalysis (EPMA)

This is a workshop for anyone interested in the capabilities of Electron Probe MicroAnalysis (EPMA), which uses characteristic x-rays to quantitatively analyze solid samples. Current users, prospective users, or the simply curious are all welcome. The course will take place over two days and include instruction from both EPMA manufacturers: CAMECA and JEOL

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November 14: Texture analysis in materials science using X-ray diffraction

X-ray diffraction is a widely used technique to determine preferred orientations. The seminar gives an overview of the theory and practice of texture analysis in materials science using modern X-ray diffraction techniques. Representations of preferred orientations, diffraction geometries and practical examples of texture analysis will be discussed.

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November 3: Convergence of Transmission Electron Microscopy Methods for Materials and Life Sciences

This one-day workshop brings together researchers who are working in both life sciences and materials sciences to discuss common transmission electron microscopy methods and new instrumentation that will advance both disciplines.

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June 14, 2017: TGA and Simultaneous DSC/TGA Analysis Workshop

This workshop will discuss capabilities of the thermogravimetric analysis (TGA), and Simultaneous TGA/DSC including the SDT Q600 from TA Instruments. This instrument provides simultaneous measurement of weight change (TGA) and true differential heat flow (DSC) on the same sample from ambient temperature to 1500 ˚C. The morning session will review measurement theory, instrumental design, experimental and method development considerations.  The afternoon session will introduce advanced techniques, such as dynamic atmosphere, hi-resolution techniques, kinetics analysis and evolved gas analysis applications.

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March 23, 2017: PANalytical/MCL Worshop: "A Practical Approach to Thin Film Metrology"

Are you analyzing thin films?  Is thin film x-ray metrology a bottleneck in your production steps?  Did you know that your PANalytical system can automate analysis of your data? Let us give you some useful tips on data collection and analysis using your PANalytical hardware and software programs.

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October 13, 2016: Applications of Infrared Spectroscopy

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Workshop about infrared spectroscopy techniques for chemical analysis in one-day seminar. Bring your samples for the analysis, discuss your application with the industry experts, and experience the latest Bruker products in special hands-on sessions. 

Applications spanning:  polymers, life sciences, semiconductors, reverse engineering, reaction monitoring, and microscopy.  Seminar will include live demonstration of Bruker FTIR instrumentation available within the Materials Characterization Lab at Penn State.

October 12, 2016: Optimization of S/TEM Specimen Prep via FIB: from Alpha to Omega

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June 12, 2016

Topics for this one day workshop include surface area, porosity, and temperature programmed techniques.

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June 8, 2016: Introduction to Scanning Electron Microscopy

This is a course for new and experienced users that covers the underlying principles and practical aspects of Scanning Electron Microscopy (SEM). The course will be divided into three basic sections.

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May 11, 2016: Fundamentals and Applications of Raman, TERS, and AFM-Raman

This 1-day workshop, with presentations from leading scientists in both academia and industry, will demonstrate how Raman spectroscopy is uniquely capable of addressing challenges across a variety of disciplines.  The state-of-the-art in Raman, AFM-Raman and key examples from the fields of 2D materials, biomaterials, forensics, and pharmaceuticals will be discussed.  This workshop is ideal for both active Raman users and those not familiar with the techniques that would like to understand what Raman and AFM-Raman can offer.

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March 30, 2016: Pace Technologies and MCL Sample Preparation Workshop

Pace Technologies’ founder and Chief Technical Officer, Dr. Donald Zipperian, will be presenting topics designed to help users achieve the best preparation possible.  Participants at this workshop will receive a FREE Metallographic Handbook written by Dr. Zipperian detailing the procedures covered by this workshop. Bring your questions about specific samples as there will be a Q&A session following the presentations.

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March 23, 2016: Innovations in Vapor Sorption Science: Materials Characterization Using Molecular Probes

Surface Measurement Systems will present a 3 hour applications-oriented seminar focused on the unique physicochemical characterization capabilities of the Gravimetric Dynamic Vapor Sorption (DVS) and Inverse Gas Chromatography (iGC) techniques. Speakers will define the fundamental chemical and physical measurement properties of each technique and highlight recent research areas where vapor sorption characterization is currently being employed. Industries include aerospace, building materials, chemicals, energy, food, filtration and separation, industrial and mineral materials, nuclear, pharmaceutical, personal care, polymers, sorbents and porous materials. Materials amenable to vapor sorption techniques include but are not limited to particles and powders, fibers, films, nanomaterials, composites and components, gels and other viscous materials.

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February 10, 2016
Advanced nano-IR-spectroscopy for chemistry, materials and life sciences

For a diverse range of applications in materials and life sciences, this talk will focus on the Nano-IR capabilities for measuring chemical composition and optical properties with nanometer scale spatial resolution. AFM-IR based infrared spectroscopy with true model free spectra and scattering scanning near field optical microscopy (s-SNOM) both overcome the diffraction limit.

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November 4, 2015
Differential Scanning Calorimetry Training Course

This course will provide a basic introduction to Differential Scanning Calorimetry (DSC). The morning session will review the theory of the DSC measurement, instrumental design, experimental and method development considerations, and include a discussion of polymer, inorganic and small molecule applications.

September 16, 2015
Elemental Analysis via Energy Dispersive Spectrometery

Energy Dispersive Spectrometry (EDS) can determine the elemental composition of a sample in the SEM. In this course you will learn how to:

  • Understand the capabilities and limitations of EDS;
  • Use the hardware and software components of the system;
  • Set up samples in the SEM and suitable acquisition conditions;
  • Become confident in routine data acquisition and processing; and,
  • Explore some of the more advanced capabilities of the system.

September 17, 2015
Electron Back Scattered Diffraction (EBSD)

In this course, you will learn how to:

  • Understand the capabilities and limitations of the EBSD technique;
  • Use the hardware and software components of the system;
  • Set up samples in the SEM and suitable acquisition conditions;
  • Become confident in routine data acquisition and processing; and,
  • Explore some of the more advanced capabilities of the system.

August 13-14, 2015:

Nanomaterials Analysis by Small Angle X-ray Scattering (SAXS)

This symposium is intended for current users of SAXS from industry, academia or government as well as those who wish to learn more about applying the technique to the analysis of nanomaterials.

June 24, 2015:
Introduction to Electron Spectroscopy and Imaging Mass Spectrometry in Materials Research and the Life Sciences

This one day workshop will introduce a trio of surface analytical techniques: Scanning Auger Microscopy (SAM); X-ray Photoelectron Spectroscopy (XPS); and Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS). These techniques provide elemental, chemical state, and molecular information about the surface of solid samples. Applications range from nanomaterials and electronic devices to tissue sections and polymer surfaces.

June 11, 2015:
Nanoparticle Characterization using Light Scattering Techniques

This workshop will focus on new developments in the characterization of nanoparticles using light scattering based instrumentation.

May 28, 2015:
Introduction to Surface Metrology: Fundamentals and Applications of Optical Profilometry Coherence Scanning Interferometry (CSI)

Fundamentals and Applications of Optical Profilometry Coherence Scanning Interferometry (CSI) is a non-contact optical profilometry method for 3-D surface height measurements. The short coherence of a white light source and long range scan devices allow reliable measurement of heights varying from nanometers to millimeters in height.

April 9, 2015:
Scanning Probe Microscopy

Scanning probe microscopy (SPM) is an umbrella term for the branch of microscopy that provides spatially localized information by raster scanning a sharp probe and a surface in close proximity to each other and monitoring probe-sample interactions.

March 19, 2015:
Crystallography for X-ray Diffractionists

This one day workshop is designed for graduate students and novice crystallographers who wish to refresh or expand their knowledge of crystallography.

March 4, 2015:
Introduction to Micro-Raman Spectroscopy

This presentation will discuss the general theory of Raman spectroscopy, the techniques that have increased its sensitivity by several orders of magnitude, and the new areas of research that have been opened by these advances.

January 29, 2015:
Dynamic Mechanical Analysis

This workshop will provide a basic introduction to Dynamic Mechanical Analysis (DMA).