This is a course for new and experienced users that covers the underlying principles and practical aspects of Scanning Electron Microscopy (SEM). The course will be divided into three basic sections. The first section will cover the basic physical components of an electron microscope and the process of moving electrons from source to sample. The second section will consist of an advanced discussion of imaging on a field emission scanning electron microscope, which will be the bulk of the discussion. The final section (second day) of the course will be a practical guide to operating a scanning electron microscope on your own samples, including tips and tricks for becoming a more efficient and effective electron microscopist. This section will focus on the FEI Nova NanoSEM, covering advanced imaging techniques specific to FEI tools.
James Ranney, FEI Applications Engineer
James Ranney graduated with a Master’s in Chemistry from the University of Oregon. He is an Applications Engineer based at the FEI NanoPort, traveling domestically and internationally to train scientists and researchers at companies and universities on SEM theory and application. James is an Oregon native and technology enthusiast.
Active RIMS Account with Valid Project Number
MSC Building, Room N-201
Date and Time
June 8, 2016 from 9:00 a.m. - 5:00 p.m.
8:30 am – 9:00 am Check-in Room N-201
Demo Date: June 9, 2016 from 9:00 a.m. - 4:00 p.m.
Demos on FEI Nova NanoSEM at Millennium Science Complex Building Room N-031K
$75.00: attendee must have an Active RIMS account: cost includes lunch for first day.
June 2, 2016
Additional Questions or Information?
Call: Colette Orlandi at 814-865-2328
Day 1 (June 8)
- Components of an SEM
- SEM Imaging
- Electron Beam Properties
- Signal Generation
- Signal Collection
- Image Formation and Interpretation
- Microscope Operation
- User Interface
- Advanced Techniques
- Efficiency: Tips and tricks
Day 2 (June 9)
Bring your samples to have James Ranney image and give you some extra tips for your specific samples.