XRD / SAXS-WAXS

The term X-ray Scattering encompasses a number of techniques. X-ray diffraction (XRD), Small (SAXS) and Wide (WAXS) angle X-ray scattering, and X-ray fluorescence (XRF) are three types of X-ray scattering measurements that MCL offers to characterize materials. The term XRD has traditionally been applied to well-ordered crystalline materials for determination of crystal structures, identification of phase composition, stress measurements, and preferred orientation and crystallinity determination, whereas the terms SAXS and WAXS have been applied to the characterization of non- or semi-crystalline materials. SAXS experiments can study electron density structures in materials on size scales greater than the electron density contrast due to atomic ordering observed in diffraction from crystalline materials and can provide information on size, shape, and distribution of electron density contrasted domains. Diffuse scattering to wide angles (WAXS) can study atomic structure in non-crystalline materials. X-ray fluorescence (XRF) is commonly used to identify the elemental composition of materials.

A variety of samples can be measured including bulk specimens, powders, thin films, liquids, gels, emulsions and more. In situ capabilities include the ability to work with wet or air sensitive specimens, at temperatures from -196 to 1600 C, in air, vacuum, or a variety of gases and at pressures up to 100 bar. These capabilities are summarized in the table below.

User Policies, Procedures, & Training

All users of analytical x-ray systems at Penn State are required to complete x-ray safety training through Environmental Health and Safety (EHS) prior to receiving instrument training. For more information on these requirements, see the EHS web site. Equipment training is provided at the hourly rate for equipment and analyst. Group training is available and can reduce cost per student significantly. Visit this webpage for training details or contact a technical staff member for more information.

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A Short Introduction to X-Ray Diffraction