Bruker Dimension Icon

Measuring conductivity of monolayer WSe2 on graphene. Credit: Penn State Lin, Robinson, and Tighe

AFM: Bruker Dimension Icon I

  • Sample Size: 210mm vacuum chuck for samples, ≤ 210mm diameter, ≤15mm thick
  • X-Y Position Noise: ≤0.15nm RMS typical imaging bandwidth (up to 625Hz)
  • Z Sensor Noise Level: 35pm RMS typical imaging bandwidth (up to 625Hz)
  • X-Y Imaging Area: 90µm x 90µm typical
  • Z range: 10µm typical in imaging and force curve modes
  • MODES:
    • Contact Mode
    • Lateral Force Microscopy
    • Conductive AFM
    • Piezo Response Microscopy
    • Scanning Capacitance Microscopy
    • Tapping Mode w/ Phase Imaging
    • Electrostatic Force Microscopy
    • Magnetic Force Microscopy
    • Kelvin Probe Force Microscopy
    • PeakForce Tapping w/ ScanAsyst
    • PeakForce Quantitative Nanomechanical Mapping
    • PeakForce TUNA
    • PeakForce Kelvin Probe Force Microscopy

AFM: Bruker Dimension Icon II

Additional capabilities from above:

  • Dimension heater/cooler stage enables AFM at two different temperature ranges:
  • -35ºC up to 100ºC
  • room temperature up to 250ºC