panalytical xpert pro mpd theta-theta diffractometer

Incident Optics
- Programmable Divergence Slit for Line Focus (PDS)
  The variable mode allows for illuminated sample irradiation from 0.5 to 20 mm in 0.5 mm increments. The fixed slit mode allows for 1/32, 1/16, 1/8, 1/4, 1/2, 1, 2, and 4 degree slit sizes. Beam masks of 5, 10, 15, and 20 mm.
- Incident Anti-Scatter Slit Device for Linear Detectors
  Incident beam anti-scatter device to be mounted on fixed or programmable divergence slits for use with linear detectors. Divergence slits of 1/32 , 1/16 , 1/8 , 1/4 , 1/2 , 1 , 2 and 4 degree.
- Fixed Soller Slit .04 Radians
  Soller slit 0.04 radians for incident and diffracted beam optics.
- X-ray Mirror PreFIX
  Incident beam PreFIX module with X-ray mirror for Cu radiation

Programmable Anti-Scatter Slit
Programmable anti-scatter slit module (PASS). Diffracted beam module with software controlled programmable antiscatter slit mechanism with automatic variable slit and fixed slit modes of operation. The variable mode allows for accurate illuminated sample irradiation tracking from a programmable divergence slit from 0.5 to 20 mm in 0.5 mm increments. The fixed slit mode allows for 1/32, 1/16, 1/8, 1/4, 1/2, 1, 2, and 4 degree slit sizes.
Fixed Soller Slit .04 Radians
Two Monochromators for PIXcel Detector - flat and curved graphite
Secondary, Thin Film Collimator .27 Degrees
Diffracted beam PreFIX parallel plate collimator. The collimator is a set of parallel plates configured to limit the angular divergence of a diffracted x-ray beam to 0.27 degrees.
PIXcel Detector
A high dynamic range (25 million counts per second per pixel row); solid state detector that can be used as both a linear and a point detector.

Angular range: For Bragg-Brentano parafocusing applications (0.5 – 167) degrees 2-theta.

Applications and Accessories:
- Bragg-Brentano parafocusing applications (loose powders, bulk solids,free-standing films, films on substrates)
- Thin film (grazing incidence) applications
- 15 Position Sample Changer and Spinner
- High Temperature Applications (max 1600 degrees C)
  - HTK-16 High Temp Stage with Controller: The system includes the complete HTK 16 stage, temperature control unit, water control device, pre-vacuum pump, turbo molecular high vacuum pump, and AP Stage mover program for compensation of sample displacement due to thermal expansion of the platinum sample strip.

Analyses:
- Phase Identification (Qualitative)
- Quantitative Analysis (RIR and Rietveld)
- Crystallinity Estimate
- Crystallite Size / Strain Estimate (Scherrer and Williamson-Hall)
- Lattice Parameter Determination
- Indexing

Data Collection Parameters
Example Description of data collection parameters using the PANalytical X'Pert Pro MPD:

XRD patterns of ABC samples were collected using a PANalytical X’Pert Pro MPD ?/? goniometer with Cu-K? radiation, and fixed slit incidence (0.5 deg. divergence, 1.0 deg. anti-scatter, specimen length 10 mm) and diffracted (0.5 deg anti-scatter, 0.02 mm nickel filter) optics. Samples were prepared by the back-loading method in which a powder sample is pressed into the cavity of a quartz low-background support. Data was collected at 45 kV and 40 mA from 5-110 deg 2? using a PIXcel detector in scanning mode with a PSD length of 3.35 deg. 2?, and 255 active channels for a duration time of ~1 hour. Resulting patterns were corrected for both 2? position and instrumental peak broadening using NIST 640c silicon and analyzed with Jade+9 software by MDI of Livermore, CA.

Sample Preparation
- Powders
  - A few grams of powder is always desirable, but often good patterns can be collected with milligram quantities
    - Qualitative Analysis – particle size 40 micron ideal (-325 mesh)
    - Quantitative Analysis – particle size 10 micron or less
- Bulk Solids, Pellets, Free-Standing films, Films on Substrates (wafers)