Techniques

Microscopy

• Atomic Force Microscopy
• Energy Dispersive X-Ray Spectroscopy
• Focused Ion Beam
• Near-Field Scanning Optical Microscopy
• Optical Profilometry
• Orientation Imaging Microscopy
• Scanning Electron Microscopy
• Transmission Electron Microscopy

Surface and Thin Film

• Auger Electron Spectroscopy
• Confocal Raman Spectroscopy
• Electron Probe MicroAnalysis
• Energy Dispersive X-Ray Spectroscopy
• X-ray Photoelectron Spectroscopy
• Rutherford Backscattering - available at Texas A&M University or Rutgers
• Secondary Ion Mass Spectrometry - available at North Carolina State University

Structural Analysis

• Small Angle X-Ray Scattering
• X-Ray Diffraction

Optical Spectroscopy

• Fourier Transform Infrared Spectroscopy (FT-IR)
  • FT-IR Macro Analysis
  • FT-IR Microscopy
• Ultraviolet-Visible Spectroscopy (UV-Vis)

Chemical Analysis

• Inductively Coupled Plasma-Atomic Emission Spectrometry
• Inductively Coupled Plasma-Mass Spectrometry
• Ion Chromatography

Physical Property Determination

• Dielectric Property Measurement Lab
• Polarization & Strain Measurement Lab
• Particle Characterization Lab
• Multi-Point BET Analyzer
• Mechanical Testing Laboratory- housed in the Penn State Department of Materials Science and Engineering
• Thermal Analysis Lab (DSC/DTA/TGA)

Materials Processing

• Electrode Sputtering

• High Temperature Furnaces
• Hot Press / Hot Isostatic Press
• Machine Shop
• Sample Preparation

Keck Smart Materials Integration Laboratory

• Thin Film Deposition and Patterning
• Thick Film Patterning and Lay-Up Facilities
• Electrical and Optical Characterization