NEWS & EVENTS

For more information about MCL news and events, please contact the MCL Administrative Office by phone (814-867-3719) or by e-mail (Leeanna Horner).

ADT 7100 Series proVectus Dicing System

proVectus

User friendly interface
Precise and accurate dicing of a wide range of materials
Tilting spindle enables dicing parts with angled edges up to 15 degrees
Spindle speed ranges from 1,000 to 60,000 RPMs
Accommodates two blade (2" and 3") sizes interchangeably
Integrated blade dressing and shaping station will dress and reshape the blade during the run to maintain optimum performance
60x to 220x zoom optics enable high accuracy dicing with thin blades
Easily cuts complex shapes on samples up to 8" in diamater (see below)

To learn more about the new system contact Maria DiCola (mld7@psu.edu; 814-863-8151).

New PANalytical Empryean Enhances and Expands MCL X-ray Diffraction Capabilities

For Powder and Bulk Specimen Applications:

Phase identification and quantification of mixtures of phases
Degree of crystallinity of the phase(s)
Structure - indexing, structure refinement /solving

PIXcel^3D detector:

Improved speed, resolution, intensity and signal-to-noise as compared to conventional diffractometers

Sample stage accommodates large samples – up to six inch wafers
Improved x-ray safety enclosure
System is fully upgradeable to take advantage of 2D and 3D imaging capabilities as the need arises

Delivery of the new Empyrean is expected by the end of 2011, and it should be installed and ready for use by late January or early February, 2012. To learn more, visit www.panalytical.com. To discuss the system in person, or set up a demo or group presentation, stop by and visit Nichole Wonderling in the new x-ray lab at MSC, room N-008 (nmw10@psu.edu; 814-863-1369).

Flexible Atomic Force Microscope with Quantitative Nanomechanical and Nanoelectrical Mapping Capabilities to be Installed in MSC

Simultaneous mapping of nanomechanical and nanoelectrical properties, Lithium ion cathode. Bruker Application Module DS090_05.

Peak Force Tapping precisely controls imaging force to keep indentations small, enabling non-destructive and high-resolution imaging. Widest operating range for samples from soft gels (~1 MPa) to rigid polymers (>20 GPa).
Quantitative nanomechanical mapping combined with a tunneling AFM module enables the collection of DMT Modulus, Adhesion, Deformation, and Conductivity while simultaneously imaging sample topography at high resolution.
SPM Modes available: Tapping Mode (air), Tapping Mode (liquid), Contact Mode, PeakForce TunaTM, PeakForce QNM®, Lateral Force Microscopy, Phase Imaging, Magnetic Force Microscopy, Electrostatic Force Microscopy, Surface Potential, Piezoresponse Microscopy.

Sea water samples: imaging of frustules.

Conductivity mapping of graphene. Sample courtesy of Dr. Josh Robinson, MatSE PSU

Quantitative Imaging of Living Biological Samples by PeakForce QNM Atomic Force Microscopy webinar from August 17, 2011 (http://www.youtube.com/watch?v=lftvMMM9ZYc&feature=related)

The Bruker Dimension Icon is a user-friendly Atomic Force Microscope that will be arriving in mid-November. Please contact Dr. Tim Tighe at tbt1@psu.edu for more information.

MCL Installs Advanced Non-contact 3D Surface Profiling Instrument in MSC

Satisfies a wide range of surface metrology needs in: geosciences, materials, optics, biomedical research, and various engineering disciplines.
Measure heights ranging from 0.1 nm up to 20000 µm at high speeds
Full complement of objectives (2.5x, 10x, 20x, 50x,100x) enable
Image areas up to 5 mm x 5 mm in seconds or utlilize stitching to image up to 6” x 6”
Quantitative dynamic measurement of devices. User defines the drive parameters for the device (voltage, signal shape, and frequency) and then chooses the appropriate dynamic metrology (single measurement, phase sweep, frequency sweep, or phase & frequency sweep). See video below.

For additional information or to schedule a demonstration please contact Dr. Josh Stapleton, jjs366@psu.edu.

Unique MSC Spaces Exceeding Expectations

“Quiet Labs” Already Improving Performance of Electron Microscopes

MRL

The improvement in microscope performance is clearly seen in the 100,000x secondary electron image of 200nm gold grains. The distortion free image collected in MSC is a direct result of the microscope being installed in a world-class ultra low vibration laboratory.

The Characterization Commons – Your Gateway to MCL

A collaborative space to facilitate interdisciplinary research and education
A large and comfortable home for users located in the heart of campus
Open access workstations running data analysis programs used in MCL
Ample whiteboard and table space
A great place to have a cup of coffee and discuss research challenges with staff
Adjacent to MCL administrative and technical staff
Located in the MSC Basement, N-050

New Equipment and Equipment Upgrades

MCL installing new FESEM for High Resolution Imaging of Uncoated Insulating and Biological Samples.

A user-friendly, field-emission scanning electron microscope (FESEM) (FEI Nova NanoSEM 630) will be available in the MSC (outside the cleanroom) by early November.

This versatile instrument will be useful for both the materials and life-sciences communities as shown in the images below.

It features:

High spatial resolution: 1.6nm resolution at 1kV
Stage for large (>6 in) specimens
-10° to 60° tilt
Variable pressure (VP) pumping for imaging uncoated insulating and life-science specimens (Figs. 1-2)
Beam deceleration™ for enhanced contrast in insulating specimens
Elemental mapping via the Oxford AZtec™ energy dispersive spectrometry (EDS) system capable of detecting elements down to Boron. (Expected installation -- Mid-January, 2012)

Figure 1: Uncoated (non-conductive) ceramic particles imaged at low vacuum. From FEI.com.

Figure 2: Salmonella bacteria imaged at low kV with beam deceleration to observe surface detail. From FEI.com.

We are confident you’ll be pleased with the NanoSEM. Contact Trevor (x5-8476) to discuss your application or schedule training.