SUMMER 2009 MCL SHORT COURSE DETAILS
SCANNING ELECTRON MICROSCOPY: IMAGING, SPECTROSCOPY, AND DIFFRACTION
Tuesday, August 18 from 9:15 a.m. to 4:30 p.m.
Room 106, The Penn Stater Conference Center Hotel, State College PA
Course Description
This course covered the following aspects of Scanning Electron Microscopy (SEM): Imaging, Spectroscopy, and Diffraction. Participants had the opportunity to learn or improve their understanding of SEM, Energy Dispersive X-ray Spectroscopy (EDS), Field Emission Scanning Electron Microscopy (FE-SEM), Orientation Imaging Microscopy (OIM), and SEM capabilities of the Focused Ion Beam (FIB). Specific information on instrumentation available to users of the Materials Characterization Laboratory (MCL) at Penn State was provided.
Course Presentations
- Scanning Electron Microscopy (SEM)
- Field-Emission Scanning Electron Microscopy (FE-SEM)
- Energy Dispersive X-ray Spectroscopy (EDS)
- Focused Ion Beam (FIB)
- Electron Back Scattering Diffraction (EBSD)
Instructors
Maria Klimkiewicz, Research Associate, Materials Research Institute, Materials Characterization Laboratory, Penn State
Mark Angelone, Senior Electron Microprobe Analyst, Materials Research Institute, Materials Characterization Laboratory, Penn State
Trevor Clark, Research Associate, Materials Research Institute, Materials Characterization Laboratory, Penn State