SUMMER 2009 MCL SHORT COURSE DETAILS

FUNDAMENTALS OF POWDER X-RAY DIFFRACTION

Theory, Instrumentation, and Sample Preparation Techniques

Thursday, August 20 from 9:15 a.m. to 4:30 p.m.
Room 106, The Penn Stater Conference Center Hotel, State College PA

Course Description

X-ray diffraction is a characterization technique that is applicable to the study of a wide variety of materials including, but not limited to: ceramics, glasses, semiconductors, soils and mineral specimens, polymers, pharmaceuticals, plant and other biological materials. It is used primarily to gain an understanding of the structure and/or composition of materials but can also provide information about degree of crystallinity, crystallite size, strain, orientation, and more.

This one-day course was an opportunity for those new to diffraction to begin to learn, or for “seasoned” users to refresh or improve their understanding of the fundamental principles related to x-ray diffraction. The class primarily focused on powder methods, with some reference to other diffraction methods and instrumentation.

The course reviewed basic diffraction theory, common instrumentation and optics, sources of error, sample preparation methods, and Rietveld refinement. Specific information on instrumentation available to users of the Materials Characterization Laboratory (MCL) at Penn State was also provided.

Course Presentations

Instructors

Mark Angelone and Nichole Wonderling are both members of MCL's experienced technical staff. The pair is responsible for the operation of MCL’s x-ray diffraction characterization facilities including powder, high resolution, small angle, Laue, and micro-focus techniques. As such, they provide assistance and guidance to Penn State researchers and industrial clients across a broad range of disciplines.