philips mpd theta-2-theta powder diffractometer
Contact for this XRD:
Nichole Wonderling
159 MRL Bldg
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Ph: 814-863-1369
- Manufacturer: Philips Analytical X-ray, The Netherlands (currently PANalytical)
- Source: Copper, long fine focus, ceramic
- Goniometer: Theta-two-theta
- Incident Optics – Tube Side:
- Soller slit – 0.04 rad
- Divergence slit – computer controlled (automated)
- Beam mask – 10 mm “typical” (line focus) – can be changed
- Receiving Optics – Detector Side:
- “Low” position – Xe filled proportional with flat graphite film monochromator , collimator 0.27
- “High” position – Miniprop with curved copper monochromator, 2 deg. anti-scatter slit, 0.30mm receiving slit, 0.04 rad soller slit
- Angular range: 2-155 deg. 2-theta “high”, 2-135 deg. 2-theta “low”
- Applications and Accessories:
- Bragg-Brentano parafocusing applications (loose powders, bulk solids, free-standing films, films on substrates)
- Grazing Incidence applications (thin films)
- Multi-purpose sample stage allows for bulk samples, wafers of varying sizes and thickness (with height / leveling adjustment)
- Analyses:
- Phase Identification (Qualitative)
- Quantitative Analysis (RIR and Rietveld)
- Crystallinity Estimate
- Crystallite Size / Strain Estimate (Scherrer and Williamson-Hall)
- Texture / Preferred Orientation (Rocking Curve)
- Lattice Parameter Determination
- Indexing
- Sample Preparation
- Powders
- A few grams of powder is always desirable, but often good patterns can be collected with milligram quantities
- Qualitative Analysis – particle size 40 micron ideal (-325 mesh)
- Quantitative Analysis – particle size 10 micron or less
- A few grams of powder is always desirable, but often good patterns can be collected with milligram quantities
- Bulk Solids, Pellets, Free-Standing films, Films on Substrates (wafers)
- Powders
- Maximum mass 1Kg
- Maximum diameter 100 mm
- Maximum thickness 100 mm