X-Ray Diffraction (XRD)
Description
X-rays with wavelength, , on the order of lattice spacing are elastically scattered (i.e., diffracted) from the atomic planes in a crystalline material yielding diffraction peaks. The condition for diffraction from planes with spacing, d, is given by Bragg’s Law: l = 2d sin (q), where q is the angle between the atomic planes and the incident x-ray beam. Resultant diffraction pattern can be used to identify unknown crystalline phases, determine residual stresses, preferred orientation or grain size.
Rates
Click here to view current pricing rates
After completing the Health Physics Course, contact the x-ray office (159 MRL), 814-863-1369, to schedule individual training throughout the year or find out about summer training schedules. Complete the x-ray account form, and obtain signatures of your advisor (students and visitors only) and the accounting personnel in your department.
Technique Advantages
- crystalline phase identification
- crystalline vs. amorphous
- non-destructive
Typical Applications
Mineral analysis in rocks, clays, refractories, pharmaceuticals, alloys, cements, industrial dusts, crystallite size estimates, stress and strain measurements
Example of grazing incidence XRD to determine interface chemistry.
Sample Requirements
- Powder samples to 325 mesh before mounting on slides or zero background holders
- Slide mounts or solid samples of polycrystalline materials may be 1.125" H x 2.5" L x 0.5" D.
- Thin film samples may be 1.125" x 1.125" x 0.5"
- Single crystal samples can be any reasonable size within weight considerations of the motorized stage, samples must be mounted on provided aluminum barrels
- Other sample types may be accommodated by special arrangements.
Other Information
- We have an XPS listserv to keep everyone informed of developments in our lab. To become a member send an email to ; the body of message should be "sub l-mcl-xps"
- Related PSU coursework
Materials Science 430, Materials Characterization, 3-credit course (Fall only)