X-Ray Diffraction (XRD)

Instrumentation

MCL currently has numerous X-Ray Diffractometers in several locations. We have powder diffraction units, a thin film unit, and single crystal units. Click on the instruments below to learn more about each one.

Scintag X2 theta-theta Powder Diffractometer (158 MRL Building)
Scintag PADV theta-2-theta Powder Diffractometer (158 MRL Building)
Philips MPD theta-2-theta Powder Diffractometer (158 MRL Building)
Philips MRD 4-circle / High Resolution (164 MRI Building)
Rigaku DMAX-Rapid Microdiffractometer (6/7 Hosler Building)
Molecular Metrology SAXS (6/7 Hosler Building)
Multiwire Backreflection Laue (156 MRL Building)

Technique Description

X-ray Diffraction is an analytical technique that utilizes an inherent property of the x-ray beam – the wavelength - and the laws of physics that determine how that beam interacts with matter to characterize materials. Classically, the technique has been applied primarily to well-ordered crystalline materials to determine crystal structures, identify phase composition, measure stress, preferred orientation and crystallinity, but the field is rapidly expanding into the characterization of non- or semi-crystalline materials such as polymers, nanoparticles, and biological materials. Scattering experiments at very small angles can study electron density structures in materials on size scales greater than the electron density contrast due to atomic ordering observed in diffraction from crystalline materials and can provide information on size, shape, and distribution of electron density contrasted domains in polymers, dilute suspensions, gels, emulsions and more (SAXS). Diffuse scattering to wide angles can study atomic structure in non-crystalline materials. Pair distribution and radial distribution analysis are examples of this type of scattering experiment.

Sample Requirements/Specifications

Sample requirements vary widely with instrument and the analysis required. Please see the specific instrument listed above for sample requirements or speak with the analyst.

Rates

Click here to view current pricing rates

User Policies, Procedures, and Training

All users of analytical x-ray systems at Penn State are required to complete x-ray safety training through Environmental Health and Safety (EHS) prior to receiving instrument training. For more information on these requirements, see the EHS web site. Equipment training is provided at the hourly rate for equipment and analyst. Consultations and assistance after training are generally given free of charge. Group training is available and can reduce cost per student significantly. Contact the analysts for more information.