Training
Initial training occurs on either our Philips EM420T (tungsten emitter) or our JEOL EM-2010 (LaB6 emitter). Training fees are $500 per user. Training includes 8 hours of personalized instruction (usually 2 students per session) plus an additional 8 hours of instrument time during which a staff member is available for technical assistance. After this training period, time on the instrument is charged at the normal hourly rate. Attaining a reasonable level of proficiency may require several more hours of instrument time. Overall time required to obtain useful results will vary depending on the background of the student and the level of difficulty of the project.
Once users have mastered the operation of the 420T or the 2010 (or both), they are eligible for training on the JEOL EM-2010F instrument. Training for the 2010F is nominally handled in a fashion similar to that for the other instruments.
It is strongly recommended that TEM users take two courses: MatSE 531 TEM (3 credits) and MatSE 511B (1 credit). Also, it is important to have (and read) the book:
"Transmission Electron Microscopy" by David B. Williams and Barry Carter, Plenum Press, NY. London 1996 (or a newer edition). The book is divided into four main parts:
- Basics
- Diffraction
- Imaging
- Spectrometry
Other useful textbooks include the following:
General reference:
- B. Fultz and J. Howe, Transmission Electron Microscopy and Diffractometry of Materials, Springer-Verlag.
More advanced:
- L. Reimer, Transmission Electron Microscopy: Physics of Image Formation and Microanalysis, Springer-Verlag, 1989.
- M. De Graef, Introduction to Conventional Transmission Electron Microscopy, Cambridge University Press, 2003.
Specialized references:
- J.C.H. Spence, Experimental High-Resolution Electron Microscopy, Clarendon Press, Oxford, 1981.
- P. Buseck, J. Cowley, and L. Eyring, eds., High-Resolution Transmission Electron Microscopy and Associated Techniques, Oxford University Press, 1992.
- J.M Cowley, Diffraction Physics, North Holland, 1984.