preliminary investigations prior to tem analysis
SEM/EDS investigation can show if different types of morphologies are present and give an x-ray spectrum showing characteristic emission lines enabling qualitative chemical analysis.
An X-ray diffraction pattern of the material can possibly determine what phases are present and allow determination of the lattice constants. From x-ray diffraction of surfaces of a solid sample preferred orientation can be determined. Thin films can also be characterized by X-ray diffraction.
An optical investigation in a transmitted light polarizing microscope of thin or crushed material can determine optical properties like color, pleochroism, opacity, birefringence, refractive indices, cleavage, and in some cases grain size and shape.
With sufficient preliminary information, an informed decision can be made as to whether or not a TEM investigation is warranted. Click here to learn about the three TEM instruments at MCL