TRANSMISSION ELECTRON MICROSCOPY (TEM)
TEM Related Links
- Starting TEM
- Training
- Preliminary Investigations
- General Guidelines for TEM Sample Prep
- Instrumentation
- Steering Committee
Contact Info:
Joe Kulik
196 MRI Bldg
Email: Validate to view contact info
Ph: 865-0344
General Description
In a transmission electron microscope (TEM), a thin specimen is irradiated with a high-energy electron beam (usually in the range of 100 to 200 keV). The beam is focused by magnetic lenses. The first few lenses before the specimen permit variation of the illumination aperture and the size of the illuminated area. The electron intensity distribution of the beam after interaction with the specimen is imaged onto a fluorescent screen by the objective lens and the post-objective lens system. Images are recorded by a digital CCD camera or, alternatively, with an electron sensitive photographic emulsion (which is chemically developed as in light photography). More information . . . click here
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Typical Applications
- Microstructure and nanostructure: size and morphology
- Phase identification at the nano-scale
- Transmission electron diffraction
- Double-tilt sample holders permit crystallographic studies, including defect analysis (dislocations, stacking faults, etc.)
- Chemical information discerned from emission of characteristic x-rays (energy dispersive spectroscopy of x-rays, or EDS)
- Chemical information discerned from ionization edges in the electron energy loss spectrum (EELS)
- High resolution images (~0.2 nm resolution)
- Formation of small electron probe allows diffraction, EDS, or EELS at the nano-scale
- Cross-section analysis (layer thickness, interface quality)
Application Examples
- Z-Contrast Imaging of InAs Quantum Wells in GaAs/AlAs Quantum Wells
- Nanocrystalline Diamond in Ru-Doped DLC Films
- XPS and HR-TEM Analysis of High k Thin Films
Other Information
- We have a TEM listserv to keep everyone informed of developments in our lab. To become a member send an email to listserv@lists.psu.edu ; the body of message should be "sub l-mcl-tem"
- Related PSU coursework
MatSE 531, Transmission Electron Microscopy, 3-credits (Spring only)
MatSE 511B, Transmission Electron Microscopy, 1-credit lab course (Spring only)