FTIR Instrumentation
Bruker IFS 66/S FT-IR Spectrometer (N007 MSC Bldg)
The IFS 66/S is a high performance research grade FT-IR spectrometer equipped with a wide range of sampling accessories. Through the use of interchangeable optical components, this spectrometer is capable of acquiring data over the near-IR (12,000-4,000 cm-1), mid-IR (4,000-400 cm-1), and far-IR (680-30 cm-1) regions.
Sampling Accessories:
- Standard Transmission
- Spectra-Tech Collector II DRIFTS Accessory
- MTEC model 300 Photoacoustic Cell
- Pike VeeMax II Variable Angle Specular Reflectance and Attenuated Total Reflectance
Hyperion 3000 FT-IR Microscope (N007 MSC Bldg)
The Hyperion 3000 FT-IR microscope enables the acquisition of mid-IR spectra from very small (>10 µm) samples with diffraction limited spatial resolution. Various collection modes are available and include: transmission, specular reflectance, attenuated total reflectance, and reflection-absorption. The microscope is equipped with brightfield, darkfield, and fluorescence illumination as well as polarization capabilities to enhance contrast and facilitate sample visualization. In addition to single point measurements, the microscope possesses extensive mapping and imaging capabilities. Use of the single element MCT detector in conjunction with the computer controlled stage permits sample mapping with a positioning accuracy of ±3 µm . The 128 x 128 element focal plane array detector enables diffraction limited mid-IR imaging of areas as large as 340 x 340 µm.
Microscope Objectives:
- 15x Transmission/Reflectance, fixed 20°-40° angle of incidence
- 20x Attenuated Total Reflectance, Ge crystal with 80 µm diameter contact surface
- 15x Grazing Angle Reflectance, double reflection, fixed 52°-84° angle of incidence, can be used with a polarizer
- 4x glass, for viewing purposes only