Friday, May 11 , 2007Volume 7, Issue 3
Summer TEM Lunch Series Established
MCL has announced a new summer lunch series to provide the research community with a regular forum to share and discuss how the Transmission Electron Microscopy (TEM) technique has or could be utilized for their research projects. This brown-bag lunch series will run every other Tuesday over the summer beginning May 22 through August 14 at 12 noon in Room 250 MRL Building.
In a Transmission Electron Microscope, a thin specimen is irradiated with a high-energy electron beam (usually in the range of 100 to 200 keV). Magnetic lenses are used to image the electron intensity distribution of the beam after interaction with the specimen thereby allowing analysis of the microstructure of the sample. As part of this summer lunch series, students and post-docs, who have been working in the TEM labs at MRI, will present examples of how they have incorporated TEM sample analysis into their research efforts.
Is TEM for you?
- Do you seek structural information on materials at the sub-micron or nanometer scale?
- Do you work with nano-structured or nano-engineered systems?
- Do you need to analyze the crystal structure of sub-micron sized particles?
- Do you need chemical information at the nanometer scale?
If you answered "yes" to any of these questions, please mark your calendar to participate in at least one of these new lunch series dates to learn more about how you can incorporate TEM sample analysis into your research efforts. If you would like more information about the lunch series, please contact TEM lab manager Joe Kulik by e-mail (juk12@psu.edu) or by phone 814-865-0344.
