Friday, May 11 , 2007Volume 7, Issue 3
Summer 2007 MCL Open Houses
MCL will be hosting free open houses on Thursday mornings throughout the summer for researchers interested in learning more about materials characterization and sample analysis. Each Thursday from June 7 through August 23, a different characterization technique will be highlighted - first, by a technique overview and discussion of MCL capabilities, followed by a lab tour and introduction to the instrumentation. The open houses, which will run from 10:00am to 12:00pm each week, will feature techniques such as:
- Atomic Force Microscopy (AFM)
- Chemical Analysis (ICP-AES and ICP-MS)
- Electrical Characterization
- Focused Ion Beam (FIB)
- Near-Field Scanning Optical Microscopy (NSOM)/Confocal Raman Spectroscopy
- Optical Spectroscopy (FTIR Micro, FTIR Macro, UV-Vis)
- Particle Characterization & Thermal Analysis
- Scanning Electron Microscopy and Orientation Imaging Microscopy (SEM and OIM)
- Surface Analysis (XPS and Auger)
- Transmission Electron Microscopy (TEM)
- X-Ray Diffraction (XRD)
- Small Angle X-Ray Scattering (SAXS)
The specific open house schedule and location are still being finalized and will be posted soon on the MCL News and Events Web site. An RSVP form will be posted as well so we can gauge interest in advance for copying handouts and event planning purposes. Please check the Web site regularly for the schedule and RSVP form and plan to attend as many of the technique open houses as your schedule permits.
