Directory Record for:

Venkatraman Gopalan

Title(s):

Associate Professor of Materials Science and Engineering

Department:

Materials Science and Engineering

College/Admin. Unit:

College of Earth and Mineral Sciences

Office Address:

253 Materials Research Laboratory Building

University Park, PA 16802

Office Phone:

(814) 865-2910

Office Fax:

(814) 865-2326

E-Mail Address:

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Web Page(s):

http://www.mri.psu.edu/faculty/gopalan

http://www.matse.psu.edu/fac/profiles/gopalan.htm

Research Synopsis:

The central theme of our group is the study of interaction of light and matter. We study synthesis of optical materials, development of novel characterization techniques, theory and modeling of light-matter interactions in nonlinear media, and the design, fabrication and testing of integrated optical devices. Our current activities are ferroelectrics, glass-ferroelectric nanocomposites, ferroelectromagnets, and artificial photonic bandgap crystals.

Technologies Impacted by Research:

Design, fabrication, and testing of integrated optical, opto-electro-mechanical and photonic bandgap crystal devices. The vision is to develop ferroelectrics as an integrated solid state optical bench on which multiple components that perform diverse functions such as lensing, scanning, frequency conversion, waveguiding, piezoelectric actuation, pyroelectric sensing, and memory storage can be fabricated on a single chip. We also have an active program in "tunable" photonic bandgap crystals.

Selected Publications:

Y. Barad, J. Lettieri, C. D. Theis, D. G. Schlom, V. Gopalan, "Domain rearrangement in Bi4Ti3O12 thin films studied by in-situ optical second harmonic generation," J. Appl. Phys. 90, 3497 (2001).
S. Kim, B. Steiner, V. Gopalan, "Direct X-ray Synchrotron imaging of strains at 180 domain walls in congruent LiNbO3 and LiTaO3 crystals," Appl. Phys. Lett.77, 2051-53 (2000).
D. A. Scrymgeour, Y. Barad, V. Gopalan, K. T. Gahagan, J. M. Robinson, Q. X. Jia, T. E. Mitchell, "A large angle electro-optic scanner on LiTaO3 fabricated by in-situ monitoring of ferroelectric domain microengineering," Appl. Optics. Vol. 40, 6236, (2001).